DSpace Repository

Fabrication and Application of TEM-compatible Sample Grids for ex situ Electrical Probing

Show simple item record

dc.contributor.author GRONENBERG, O.
dc.contributor.author CARSTENS, N.
dc.contributor.author VAHL, A.
dc.contributor.author FAUPEL, F.
dc.contributor.author KIENLE, L.
dc.date.accessioned 2020-05-29T23:47:17Z
dc.date.available 2020-05-29T23:47:17Z
dc.date.issued 2019
dc.identifier.citation GRONENBERG, O., CARSTENS, N., VAHL, A. et al. Fabrication and Application of TEM-compatible Sample Grids for ex situ Electrical Probing. In: ICNMBE-2019: International conference on Nanotechnologies and Biomedical Engineering: proc. of the 4rd intern. conf., Sept. 18-21, 2019: Program and Abstract Book. Chişinău, 2019, p. 88. ISBN 978-9975-72-392-3. en_US
dc.identifier.isbn 978-9975-72-392-3
dc.identifier.uri http://repository.utm.md/handle/5014/8474
dc.identifier.uri https://doi.org/10.1007/978-3-030-31866-6_15
dc.description Access full text - https://doi.org/10.1007/978-3-030-31866-6_15 en_US
dc.description.abstract Memristors are promising candidates for new memory technologies and are capable to mimic neural networks. The switching in memristive devices occurs typically in few nanometer thin oxide layers. The direct observation of the switching mechanism is crucial for better comprehension and improvements of memristors. Therefore, in situ experiments are conducted in a transmission electron microscope (TEM). However, electron beam irradiation can lead to a chemical modification of the active layers. Moreover, devices may show different performance due to the details of processing parameters. Thus, it is essential to characterize memristors electrically before microstructural analysis. In this work a TEM compatible grid is developed, which can be used for ex situ electrical probing and TEM investigations. Different techniques for the production, like shadowing and lithography are compared with their advantages and drawbacks. en_US
dc.language.iso en en_US
dc.publisher Tehnica UTM en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject memristor en_US
dc.subject nanomaterials en_US
dc.title Fabrication and Application of TEM-compatible Sample Grids for ex situ Electrical Probing en_US
dc.type Article en_US


Files in this item

The following license files are associated with this item:

This item appears in the following Collection(s)

Show simple item record

Attribution-NonCommercial-NoDerivs 3.0 United States Except where otherwise noted, this item's license is described as Attribution-NonCommercial-NoDerivs 3.0 United States

Search DSpace


Advanced Search

Browse

My Account