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Integral Estimate of LSI Radiation Hardness as a Fuzzy Number of Multiplicity of Nodes

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dc.contributor.author BARBASHOV, V. M.
dc.contributor.author TRUSHKIN, N. S.
dc.contributor.author OSIPOV, A. K.
dc.date.accessioned 2020-05-31T12:43:13Z
dc.date.available 2020-05-31T12:43:13Z
dc.date.issued 2019
dc.identifier.citation BARBASHOV, V. M., TRUSHKIN, N. S., OSIPOV, A. K. Integral Estimate of LSI Radiation Hardness as a Fuzzy Number of Multiplicity of Nodes. In: ICNMBE: International conference on Nanotechnologies and Biomedical Engineering: proc. of the 4rd intern. conf., Sept. 18-21 : Program & Abstract Book , 2019. Chişinău, 2019, p. 165. ISBN 978-9975-72-392-3. en_US
dc.identifier.isbn 978-9975-72-392-3
dc.identifier.uri https://doi.org/10.1007/978-3-030-31866-6_144
dc.identifier.uri http://repository.utm.md/handle/5014/8515
dc.description Access full text - https://doi.org/10.1007/978-3-030-31866-6_144 en_US
dc.description.abstract The analysis of the LSI behavior under radiation exposure at functional and logical level of description was carried out. It is shown that there are deterministic and non- deterministic failures typical when exposed to ionizing radiation. In the first case, the behavior of complex devices is determined by the specific ratio of the radiation-sensitive parameters of the elements, in the second case - the statistical variation of the failure threshold levels for the same type of samples. en_US
dc.language.iso en en_US
dc.publisher Tehnica UTM en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject topological probabilistic models en_US
dc.subject fuzzy probability en_US
dc.subject uncertainty zone en_US
dc.title Integral Estimate of LSI Radiation Hardness as a Fuzzy Number of Multiplicity of Nodes en_US
dc.type Article en_US


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