Elastic Coupling at Epitaxial Multiferroic Interfaces: in situ X-ray Studies of Electric Field Induced Strain

KOOPS, C. T.; HRKAC, S. B.; ABES, M.; JORDT, P.; STETTNER, J.; PETRARU, A.; KOHLSTEDT, H.; HRKAC, V.; WOLFF, N.; KIENLE, L.; SEECK, O. H.; NISBET, G.; MAGNUSSEN, O. M.; MURPHY, B. M.

DSpace Home
→
Facultatea Calculatoare, Informatică şi Microelectronică
→
Conferinţe
→
Conferinţa ICNBME - International Conference on Nanotechnologies and Biomedical Engineering
→
2019
→
View Item

Elastic Coupling at Epitaxial Multiferroic Interfaces: in situ X-ray Studies of Electric Field Induced Strain

KOOPS, C. T.; HRKAC, S. B.; ABES, M.; JORDT, P.; STETTNER, J.; PETRARU, A.; KOHLSTEDT, H.; HRKAC, V.; WOLFF, N.; KIENLE, L.; SEECK, O. H.; NISBET, G.; MAGNUSSEN, O. M.; MURPHY, B. M.

URI: http://repository.utm.md/handle/5014/8523
https://doi.org/10.1007/978-3-030-31866-6_38

Date: 2019

Abstract:

The elastic coupling in multiferroic materials and even more so in magnetoelectric composites plays an important role for the properties and function. In this study, the electrically induced strain at the epitaxial interface of 0.72Pb(Mn1/3Nb2/3)O3-0.28PbTiO3-CoFe2O4, a magnetoelectric composite, is characterized by in situ X-ray scattering experiment and transmission electron microscopy study. For the measured range all strain induced lattice changes are reversible ruling out plastic deformation. The surprisingly non-perfect elastic coupling of 87 ± 7% in this epitaxial system can be explained by the presence of planar defects in the CFO film.