dc.contributor.author | RODIN, A. S. | |
dc.contributor.author | BAKERENKOV, A. S. | |
dc.contributor.author | FELITSYN, V. A. | |
dc.contributor.author | PERSHENKOV, V. S. | |
dc.contributor.author | TELETS, V. A. | |
dc.date.accessioned | 2020-06-01T12:37:37Z | |
dc.date.available | 2020-06-01T12:37:37Z | |
dc.date.issued | 2019 | |
dc.identifier.citation | RODIN, A. S., BAKERENKOV, A. S., FELITSYN, V. A. et al. Evaluation of Radiation Hardness of the Bipolar Devices in the Space Conditions. In: ICNMBE-2019: International Conference on Nanotechnologies and Biomedical Engineering: proc. of the 4rd intern. Conf., Sept. 18-21, 2019: Program and abstract book. Chişinău, 2019, p. 168. ISBN 978-9975-72-392-3. | en_US |
dc.identifier.isbn | 978-9975-72-392-3 | |
dc.identifier.uri | https://doi.org/10.1007/978-3-030-31866-6_143 | |
dc.identifier.uri | http://repository.utm.md/handle/5014/8544 | |
dc.description | Access full text - https://doi.org/10.1007/978-3-030-31866-6_143 | en_US |
dc.description.abstract | Real time dependence of operation temperature, which is typical for space environment, was taken into account in the numerical simulation of radiation degradation of LM111 bipolar voltage comparator input current. The technique and results of performed numerical analyses are presented and discussed. | en_US |
dc.language.iso | en | en_US |
dc.publisher | Tehnica UTM | en_US |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 United States | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/us/ | * |
dc.subject | radiation hardness | en_US |
dc.subject | voltage comparators | en_US |
dc.subject | bipolar devices | en_US |
dc.title | Evaluation of Radiation Hardness of the Bipolar Devices in the Space Conditions | en_US |
dc.type | Article | en_US |
The following license files are associated with this item: