“True” Dose Rate Effect of the ELDRS Conversion Model

PERSHENKOV, V. S.; BAKERENKOV, A. S.; TELETS, V. A.; BELYAKOV, V. V.; FELITSYN, V. A.; RODIN, A. S.

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“True” Dose Rate Effect of the ELDRS Conversion Model

PERSHENKOV, V. S.; BAKERENKOV, A. S.; TELETS, V. A.; BELYAKOV, V. V.; FELITSYN, V. A.; RODIN, A. S.

URI: https://doi.org/10.1007/978-3-030-31866-6_13
http://repository.utm.md/handle/5014/8545

Date: 2019

Abstract:

Modification of the ELDRS (Enhanced Low Dose Rate Sensitivity) conversion model is presented. The effect of the oxide trapped charge on the value of the oxide electric field and the yield of the oxide charge takes into account. It leads to dependence of the accumulation of radiation-induced oxide charge and interface traps on the dose rate. In enhancement version the ELDRS conversion model describes the low dose rate effect as “true” dose rate effect.