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| dc.contributor.author | PERSHENKOV, V. S. | |
| dc.contributor.author | BAKERENKOV, A. S. | |
| dc.contributor.author | TELETS, V. A. | |
| dc.contributor.author | BELYAKOV, V. V. | |
| dc.contributor.author | FELITSYN, V. A. | |
| dc.contributor.author | RODIN, A. S. | |
| dc.date.accessioned | 2020-06-01T12:46:22Z | |
| dc.date.available | 2020-06-01T12:46:22Z | |
| dc.date.issued | 2019 | |
| dc.identifier.citation | PERSHENKOV, V. S., BAKERENKOV, A. S., TELETS, V. A. et al. “True” Dose Rate Effect of the ELDRS Conversion Model. In: ICNMBE-2019: International Conference on Nanotechnologies and Biomedical Engineering: proc. of the 4rd intern. Conf., Sept. 18-21, 2019: Program and abstract book. Chişinău, 2019, p. 168. ISBN 978-9975-72-392-3. | en_US |
| dc.identifier.isbn | 978-9975-72-392-3 | |
| dc.identifier.uri | https://doi.org/10.1007/978-3-030-31866-6_13 | |
| dc.identifier.uri | http://repository.utm.md/handle/5014/8545 | |
| dc.description | Access full text - https://doi.org/10.1007/978-3-030-31866-6_13 | en_US |
| dc.description.abstract | Modification of the ELDRS (Enhanced Low Dose Rate Sensitivity) conversion model is presented. The effect of the oxide trapped charge on the value of the oxide electric field and the yield of the oxide charge takes into account. It leads to dependence of the accumulation of radiation-induced oxide charge and interface traps on the dose rate. In enhancement version the ELDRS conversion model describes the low dose rate effect as “true” dose rate effect. | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Tehnica UTM | en_US |
| dc.rights | Attribution-NonCommercial-NoDerivs 3.0 United States | * |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/us/ | * |
| dc.subject | enhanced low dose date sensitivity | en_US |
| dc.subject | radiation hardness | en_US |
| dc.subject | interfaces traps | en_US |
| dc.title | “True” Dose Rate Effect of the ELDRS Conversion Model | en_US |
| dc.type | Article | en_US |
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