dc.contributor.author | VERJBIŢKI, Valeri | |
dc.contributor.author | LUPAN, Oleg | |
dc.date.accessioned | 2022-05-26T12:35:06Z | |
dc.date.available | 2022-05-26T12:35:06Z | |
dc.date.issued | 2018 | |
dc.identifier.citation | VERJBIŢKI, Valeri, LUPAN, Oleg. Device and method for measuring the resistance of sensors based on nanostructured semiconductor oxides. In: European Exhibition of Creativity and Innovation: proc. of the 10th ed. EUROINVENT, Iasi, Romania, 2018, pp. 176-177. ISSN 2601-4564. e-ISSN 2601-4572. | en_US |
dc.identifier.issn | 2601-4564 | |
dc.identifier.issn | 2601-4572 | |
dc.identifier.uri | http://repository.utm.md/handle/5014/20440 | |
dc.description | Patent: MD 1065 Y 2016.08.31. Exibits Clasification: 1. Environment - Pollution Control. | en_US |
dc.description.abstract | The invention relates to the field of measuring equipment and can be used in measuring apparatuses that use sensors based on nanostructured semiconductor oxides. | en_US |
dc.language | en | |
dc.publisher | Romanian Inventors Forum | en_US |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 United States | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/us/ | * |
dc.subject | invenţii | en_US |
dc.subject | inventions | en_US |
dc.subject | measuring equipment | en_US |
dc.subject | measuring apparatuses | en_US |
dc.subject | sensors | en_US |
dc.subject | nanostructured semiconductor oxides | en_US |
dc.title | Device and method for measuring the resistance of sensors based on nanostructured semiconductor oxides | en_US |
dc.type | Article | en_US |
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