COJOCARU, Ion; ŞERBANAŢI, Luca; PĂVĂLOIU, Bujor; RADOVICI, Alexandru; VASILOŢEANU, Andrei
(Technical University of Moldova, 2009)
Functionality increase led to maximizing of the integrated circuits (IC) complexity. The time for test generation reached up to 10-15 months, and some of the faults of the combinational circuits (CC) with convergent fan-outs ...