IRTUM – Institutional Repository of the Technical University of Moldova

Browsing Conferinţa "Microelectronics and Computer Science" by Subject "testability"

Browsing Conferinţa "Microelectronics and Computer Science" by Subject "testability"

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  • COJOCARU, Ion; FLUERASU, Cezar; PASCU, Adrian (Technical University of Moldova, 2005)
    A new concept of design for testability is being proposed, based on the properties of signals, gates and logical structures. This allows obtaining of reconfigurable elementary digital structures (REDS), which can work both ...
  • COJOCARU, Ion; ŞERBANAŢI, Luca; PĂVĂLOIU, Bujor; RADOVICI, Alexandru; VASILOŢEANU, Andrei (Technical University of Moldova, 2009)
    The problem of easy testable digital circuits’ design, which appeared in the 60s of the last century, being in the permanent focus of the digital circuits’ producers, has not found its adequate solution yet. Complexity of ...

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