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Browsing Conferinţa "Microelectronics and Computer Science" by Subject "teste de corecție"

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Применение устройства для корректурных проб

ROMANENKO, Alexandr; BALMUS, Ion (Technical University of Moldova, 2017)

В статье рассматривается метод для исследования внимания испытуемого при помощи устройства для корректурных проб.

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