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dc.contributor.author COJOCARU, Ion
dc.contributor.author EŞANU, Mariana
dc.date.accessioned 2019-10-22T13:25:34Z
dc.date.available 2019-10-22T13:25:34Z
dc.date.issued 2014
dc.identifier.citation COJOCARU, Ion, EŞANU, Mariana. Functional aspects in the design for testability. In: Microelectronics and Computer Science: proc. of the 8th intern. conf., October 22-25, 2014. Chişinău, 2014, pp. 295-298. ISBN 978-9975-45-329-5. en_US
dc.identifier.isbn 978-9975-45-329-5
dc.identifier.uri http://repository.utm.md/handle/5014/5035
dc.description.abstract Addressing Design for testability of digital structures requires performing complex studies of phenomena at the frontiers of scientific directions as mathematical logic, physics, chemistry, biology. Half a century passed from the moment of issue of Integrated Circuits Design for testability has not yielded the expected results, which confirms the need for a new paradigm based on the principles of the very nature of existence. Creating the design for testability paradigm involves research, analysis, and use of certain functional aspects between logical functions of different structures. This can lead to the creation of new types of elementary structures and properties intrinsic to the development of modern theories and efficient design for testability. Are highlighted and considered various functional forms of logical functions: equivalent, reverse duality complementary. These functional aspects can be considered as a small step towards establishing innovative concepts of the future transition to the new state of knowledge. The paper is based on analysis of reference works in research logic algebra functions and design for testability. en_US
dc.language.iso en en_US
dc.publisher Tehnica UTM en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject design for testability en_US
dc.subject echivalence en_US
dc.subject inversion en_US
dc.subject duality en_US
dc.subject complementarity en_US
dc.title Functional aspects in the design for testability. en_US
dc.type Article en_US


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