Investigation of thin optically anisotropic ZnO films placed in a strong uniform magnetic field

VENGER, E. F.; IEVTUSHENKO, A. I.; MELNICHUK, L. Yu.; MELNICHUK, O. V.

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dc.contributor.author	VENGER, E. F.
dc.contributor.author	IEVTUSHENKO, A. I.
dc.contributor.author	MELNICHUK, L. Yu.
dc.contributor.author	MELNICHUK, O. V.
dc.date.accessioned	2019-11-06T14:03:47Z
dc.date.available	2019-11-06T14:03:47Z
dc.date.issued	2011
dc.identifier.citation	VENGER, E. F., IEVTUSHENKO, A. I., MELNICHUK, L. Yu. Investigation of thin optically anisotropic ZnO films placed in a strong uniform magnetic field. In: Microelectronics and Computer Science: proc. of the 7th intern. Conf., September 22-24, 2011. Chişinău, 2011, vol. 1, p. 103. ISBN 978-9975-45-174-1.	en_US
dc.identifier.isbn	978-9975-45-174-1
dc.identifier.uri	http://repository.utm.md/handle/5014/6253
dc.description.abstract	We present the results of IR spectroscopy and attenuated total reflection (ATR) investigations of the properties of polar optically anisotropic ZnO films on hexagonal 6H-SiC single crystals. The ATR and IR reflection spectra were taken using a spectrophotometer ИКС-31 with an attachment ИПО-22 and НПВО-2, in the actual frequency region for ZnO film (400600 cm-1) and 6H-SiC substrate (788−970 cm-1).	en_US
dc.language.iso	en	en_US
dc.publisher	Technical University of Moldova	en_US
dc.rights	Attribution-NonCommercial-NoDerivs 3.0 United States	*
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/3.0/us/	*
dc.subject	spectroscopy	en_US
dc.subject	attenuated reflection	en_US
dc.subject	films	en_US
dc.subject	single crystals	en_US
dc.title	Investigation of thin optically anisotropic ZnO films placed in a strong uniform magnetic field	en_US
dc.type	Article	en_US