dc.contributor.author | LEBEDEV, A. A. | |
dc.contributor.author | FELITSYN, V. A. | |
dc.contributor.author | KOMLEVA, V. A. | |
dc.contributor.author | KOMLEV, A. A. | |
dc.date.accessioned | 2020-05-19T11:43:23Z | |
dc.date.available | 2020-05-19T11:43:23Z | |
dc.date.issued | 2015 | |
dc.identifier.citation | LEBEDEV, A. A., FELITSYN, V. A., KOMLEVA, V. A. et al. The Circuit Method for Decreasing of Sensitivity to ASET Effect for Bipolar Operational Amplifiers. In: ICNMBE: International conference on Nanotechnologies and Biomedical Engineering: proc. of the 3rd intern. conf., Sept. 23-26 : Program & Abstract Book , 2015. Chişinău, 2015, p. 122. | en_US |
dc.identifier.uri | https://doi.org/10.1007/978-981-287-736-9_126 | |
dc.identifier.uri | http://repository.utm.md/handle/5014/8292 | |
dc.description | Access full text - https://doi.org/10.1007/978-981-287-736-9_126 | en_US |
dc.description.abstract | The schematic method for increasing of radiation hardness of bipolar operational amplifiers for ASET effects is presented. The method is based on the use of improved current mirror and modified input stage circuit. | en_US |
dc.language.iso | en | en_US |
dc.publisher | Tehnica UTM | en_US |
dc.rights | Attribution-NonCommercial-NoDerivs 3.0 United States | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/us/ | * |
dc.subject | single-event transients | en_US |
dc.subject | operational amplifiers | en_US |
dc.subject | common mode rejection ratio | en_US |
dc.subject | differential stage | en_US |
dc.title | The Circuit Method for Decreasing of Sensitivity to ASET Effect for Bipolar Operational Amplifiers | en_US |
dc.type | Article | en_US |
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