IRTUM – Institutional Repository of the Technical University of Moldova

Micromechanical Properties and Plastic Deformation Features of the Pb1-xYbxTe Ternary Semiconductors

Show simple item record

dc.contributor.author GRABCO, D. Z.
dc.contributor.author NICORICI, V. Z.
dc.contributor.author BARBOS, Z. A.
dc.contributor.author TOPAL, D.
dc.contributor.author SHIKIMAKA, O. A.
dc.date.accessioned 2020-05-30T19:32:46Z
dc.date.available 2020-05-30T19:32:46Z
dc.date.issued 2019
dc.identifier.citation GRABCO, D. Z., NICORICI, V. Z., BARBOS, Z. A. et al. Micromechanical Properties and Plastic Deformation Features of the Pb1-xYbxTe Ternary Semiconductors. In: ICNMBE-2019: International conference on Nanotechnologies and Biomedical Engineering: proc. of the 4rd intern. conf., Sept. 18-21, 2019: Program and Abstract Book. Chişinău, 2019, p. 91. ISBN 978-9975-72-392-3. en_US
dc.identifier.isbn 978-9975-72-392-3
dc.identifier.uri http://repository.utm.md/handle/5014/8493
dc.identifier.uri https://doi.org/10.1007/978-3-030-31866-6_31
dc.description Access full text - https://doi.org/10.1007/978-3-030-31866-6_31 en_US
dc.description.abstract In this paper, the effect of ytterbium (Yb) impurity on the microstructure, the specificity of plastic deformation and the strength properties of PbTe crystals has been studied. The researches have been conducted on a PMT-3 microhardness tester using loads in the range (50–1000) mN. For all applied loads, the Pb1-xYbxTe (x = 0.0025; 0.0075 and 0.01 at.%) single crystals showed pronounced plasticity and very low hardness values (H = 0.35–0.39 GPa), which is characteristic of compounds containing lead. It was suggested that the deformation of Pb1−xYbxTe crystals under microindentation occurs by a dislocation mechanism with some contribution of the structure compaction in the bulk beneath the indentations. en_US
dc.language.iso en en_US
dc.publisher Tehnica UTM en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject single crystals en_US
dc.subject microhardness en_US
dc.subject microstructure en_US
dc.title Micromechanical Properties and Plastic Deformation Features of the Pb1-xYbxTe Ternary Semiconductors en_US
dc.type Article en_US


Files in this item

The following license files are associated with this item:

This item appears in the following Collection(s)

Show simple item record

Attribution-NonCommercial-NoDerivs 3.0 United States Except where otherwise noted, this item's license is described as Attribution-NonCommercial-NoDerivs 3.0 United States

Search DSpace


Browse

My Account