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“True” Dose Rate Effect of the ELDRS Conversion Model

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dc.contributor.author PERSHENKOV, V. S.
dc.contributor.author BAKERENKOV, A. S.
dc.contributor.author TELETS, V. A.
dc.contributor.author BELYAKOV, V. V.
dc.contributor.author FELITSYN, V. A.
dc.contributor.author RODIN, A. S.
dc.date.accessioned 2020-06-01T12:46:22Z
dc.date.available 2020-06-01T12:46:22Z
dc.date.issued 2019
dc.identifier.citation PERSHENKOV, V. S., BAKERENKOV, A. S., TELETS, V. A. et al. “True” Dose Rate Effect of the ELDRS Conversion Model. In: ICNMBE-2019: International Conference on Nanotechnologies and Biomedical Engineering: proc. of the 4rd intern. Conf., Sept. 18-21, 2019: Program and abstract book. Chişinău, 2019, p. 168. ISBN 978-9975-72-392-3. en_US
dc.identifier.isbn 978-9975-72-392-3
dc.identifier.uri https://doi.org/10.1007/978-3-030-31866-6_13
dc.identifier.uri http://repository.utm.md/handle/5014/8545
dc.description Access full text - https://doi.org/10.1007/978-3-030-31866-6_13 en_US
dc.description.abstract Modification of the ELDRS (Enhanced Low Dose Rate Sensitivity) conversion model is presented. The effect of the oxide trapped charge on the value of the oxide electric field and the yield of the oxide charge takes into account. It leads to dependence of the accumulation of radiation-induced oxide charge and interface traps on the dose rate. In enhancement version the ELDRS conversion model describes the low dose rate effect as “true” dose rate effect. en_US
dc.language.iso en en_US
dc.publisher Tehnica UTM en_US
dc.rights Attribution-NonCommercial-NoDerivs 3.0 United States *
dc.rights.uri http://creativecommons.org/licenses/by-nc-nd/3.0/us/ *
dc.subject enhanced low dose date sensitivity en_US
dc.subject radiation hardness en_US
dc.subject interfaces traps en_US
dc.title “True” Dose Rate Effect of the ELDRS Conversion Model en_US
dc.type Article en_US


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