The plasticity index of Cu films with different thicknesses on hard substrate

PYRTSAC, C. M.

dc.contributor.author	PYRTSAC, C. M.
dc.date.accessioned	2021-11-05T11:10:00Z
dc.date.available	2021-11-05T11:10:00Z
dc.date.issued	2016
dc.identifier.citation	PYRTSAC, C. M. The plasticity index of Cu films with different thicknesses on hard substrate. In: Materials Science and Condensed Matter Physics: proc.: ed. 8, 12-16 sept. 2016, Chişinău, Moldova, 2016, p. 168. ISBN 978-9975-9787-1-2.	en_US
dc.identifier.isbn	978-9975-9787-1-2
dc.identifier.uri	http://repository.utm.md/handle/5014/17901
dc.description.abstract	In this paper the Cu/MgO and Cu/Si CSs were selected for the investigation of the plasticity index behavior. The nano-microhardness of the MgO and Si single crystals using as a substrate is 10-12 times higher in comparison with the polycrystalline Cu, so the CSs obtained are of type "soft-to-hard". The Cu films with thickness t=85; 470 and 1000 nm were deposited on the MgO and Si substrates by the magnetron sputtering method. Hardness (H) and Young’ modulus (E) were studied by the dynamic indentation method using the Nanotester-PMT3-NI–02 device equipped with a Berkovich indenter in a load range of Pmax=(5÷900) mN.	en_US
dc.language.iso	en	en_US
dc.publisher	Institutul de Fizică Aplicată al AŞM	en_US
dc.rights	Attribution-NonCommercial-NoDerivs 3.0 United States	*
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/3.0/us/	*
dc.subject	composite structures	en_US
dc.subject	plasticity	en_US
dc.subject	single crystals	en_US
dc.subject	crystals	en_US
dc.subject	films	en_US
dc.title	The plasticity index of Cu films with different thicknesses on hard substrate	en_US
dc.type	Article	en_US