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Electrical Noise and Semiconductor Reliability
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| dc.contributor.author | BĂJENESCU, Titu-Marius I. | |
| dc.date.accessioned | 2024-06-17T10:54:07Z | |
| dc.date.available | 2024-06-17T10:54:07Z | |
| dc.date.issued | 2023 | |
| dc.identifier.citation | BĂJENESCU, Titu-Marius I. Electrical Noise and Semiconductor Reliability. In: Electrotehnica, Electronica, Automatica, 2024, vol. 71, pp. 51-58. e-ISSN 2392-828X. | en_US |
| dc.identifier.issn | 2392-828X | |
| dc.identifier.uri | https://doi.org/10.46904/eea.23.71.4.1108006 | |
| dc.identifier.uri | http://repository.utm.md/handle/5014/27451 | |
| dc.description.abstract | Low-frequency electrical noise is a sensitive measure of defects in semiconductor devices because the noise has an impact, directly or indirectly, on the performance and reliability of the device. Its measurement is particularly important to characterize noise in semiconductor devices. | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | INCDIE ICPE-CA Romania | en_US |
| dc.relation.ispartofseries | Electrotehnica, Electronica, Automatica (EEA);2024, vol. 71 | |
| dc.rights | Attribution-NonCommercial-NoDerivs 3.0 United States | * |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/3.0/us/ | * |
| dc.subject | semiconductor devices | en_US |
| dc.subject | electrical noise | en_US |
| dc.subject | defects | en_US |
| dc.subject | single crystals | en_US |
| dc.subject | noise voltage | en_US |
| dc.title | Electrical Noise and Semiconductor Reliability | en_US |
| dc.type | Article | en_US |
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