Peculiarities of phase transformation in crystalline silicon under local loading

SHIKIMAKA, O.; PRISACARU, A.; PYRTSAC, C.

dc.contributor.author	SHIKIMAKA, O.
dc.contributor.author	PRISACARU, A.
dc.contributor.author	PYRTSAC, C.
dc.date.accessioned	2021-11-05T07:54:44Z
dc.date.available	2021-11-05T07:54:44Z
dc.date.issued	2010
dc.identifier.citation	SHIKIMAKA, O., PRISACARU, A., PYRTSAC, C. Peculiarities of phase transformation in crystalline silicon under local loading. In: Materials Science and Condensed Matter Physics: proc. : ed. 5, 13-17 septembrie 2010, Chişinău, Moldova, 2010, p. 127.	en_US
dc.identifier.uri	http://repository.utm.md/handle/5014/17892
dc.description.abstract	The investigation of phase transformation induced by nano- and microindentation of Si (100) under different loading conditions has been carried out in this work. The influence of different loading regimes was considered by using instrumented nano/microindentation technique with continuous registration of loaddisplacement (P-h) curve, as well as by using quasistatic microindentation technique. The effect of different types of indenters was also taken into consideration: Berkovich trihedral diamond pyramid with 150 nm tip rounding for the former technique and Vickers tetrahedral diamond pyramid with 4,5 μm tip rounding for the latter one. The investigation of phase transformation under local loading was studied by means of micro-Raman spectroscopy.	en_US
dc.language.iso	en	en_US
dc.publisher	Institutul de Fizică Aplicată al AŞM	en_US
dc.rights	Attribution-NonCommercial-NoDerivs 3.0 United States	*
dc.rights.uri	http://creativecommons.org/licenses/by-nc-nd/3.0/us/	*
dc.subject	crystalline silicon	en_US
dc.subject	nanoindentations	en_US
dc.subject	microindentation	en_US
dc.subject	phase transformation	en_US
dc.title	Peculiarities of phase transformation in crystalline silicon under local loading	en_US
dc.type	Article	en_US